im4000 ion milling machine

Ion Milling System IM4000Plus : Hitachi High Technologies

The Hitachi IM4000Plus Ar ion milling system provides two milling configurations in a single instrument. Previously two separate systems were needed to perform both cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), but with Hitachi's IM4000Plus, both applications can be run within the same machine.

IM4000PLUS Series Ion Milling System YouTube

Oct 16, 2015· The IM4000 Plus Series Ion-Milling Systems are the second-generation IM4000 series hybrid instruments supporting Cross-Section Milling and Flatmilling®. A wide variety of system configurations

Author: HitachiHTA

Introduction of the IM4000 optional device SI NEWS

Introduction. The Hitachi IM4000 Ion Milling System (hereinafter simply the IM4000) was released in late 2010 1) as a device offering two key features: (a) as a hybrid ion-milling machine supporting both cross-section and flat milling—two widely used types of ion milling—the machine meets a wide variety of needs spanning the fields of material science and device engineering, and (b) the

Im4000 Ion Milling Machine nizzisara

Ion Milling System IM4000 : High-Technologies in Europe. ion milling equipment IM4000 is introduced from but with ''s new IM4000, both applications can be run within the same machine. Ion milling machine thins samples until they are transparent to electrons by firing ions (typically argon) at the surface from an angle and sputtering. Contact

Hitachi Model IM4000 Milling System OBE 0038. Sage

Hitachi Model IM4000 Milling System OBE 0038. In contrast, Sage Analytical Lab’s ion beam sputtering is a stress-free physical process whereby atoms are ejected from a target material due to bombardment of the target by energetic particles.

Hitachi Ion Milling System

cross-section milling Sample Observation during Ion Milling The IM4000 has an observation port, for in-situ specimen observation. In addition, when using the stereoscopic microscope (option: Binocular type or Tri-eye type) for sample observation during ion milling, the processing surface can be observed up to 100 times magnification.

Brochure IM4000 Ion Milling System : Hitachi High

The new Hitachi IM4000 Ar ion milling system offers cross-section and flat ion milling configurations in one instrument. Hitachi IM4000 Ion Milling E-Brochure HTD-E197R.pdf (PDF format, 1,623kBytes)

Major specification

The Hitachi IM4000 Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider undistorted cross-sections without applying mechanical stress to the sample. A mask is placed directly on top of the sample, which is not only used for protecting the top surface but also

The FlexSEM 1000: A Scanning Electron Microscope

argon ion polishing machine « Mining

IM4000 Ion Milling System High Technologies America, Inc. The IM4000 Ar ion milling system makes two milling configurations available 's new IM4000 now allows to run both applications within the same machine. Conventional mechanical polishing or cutting techniques on soft and »More detailed

IM4000 Ion Milling System Hitachi High Technologies

The Hitachi IM4000 Ar ion milling system makes two milling configurations available in a single instrument. While previously two separate systems were needed to perform both, cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), Hitachi's new IM4000 now allows to run both applications within the same machine.

Hitachi Broad Beam Ion Mill Demo on Oct 24, 2018

Hitachi and Geosciences to host a demo of IM40000Plus high-speed mill. The Hitachi IM4000 Ion Milling System was released in late 2010 as a device offering two key features: (a) as a hybrid ion-milling machine supporting both cross-section and flat milling—two widely used types of ion milling—the machine meets a wide variety of needs spanning the fields of material science and

What is Ion Milling? AJA International

What is ion milling ? Ion Milling is a physical etching technique whereby the ions of an inert gas (typically Ar) are accelerated from a wide beam ion source into the surface of a substrate (or coated substrate) in vacuum in order to remove material to some desired depth or underlayer. It is easily visualized as "atomic sandblasting", or more

Gatan 600A Ion Mill YouTube

Aug 27, 2012· Bid Service, LLC Video Demo\Walkaround Gatan 600A Ion Mill View 720p Bid Service, LLC We BUY & SELL used equipment! For more information regarding products...

SCIENTIFIC INSTRUMENT NEWS 7 SEPTEMBER

The Hitachi IM4000 Ion Milling System (hereinafter simply the IM4000) was released in late 20101) as a device offering two key features: (a) as a hybrid ion-milling machine supporting both cross-section and flat milling—two widely used types of ion milling—the machine meets a wide variety of needs spanning the fields of material science

argon ion milling machine MC Machinery

Argon Ion Milling Machine (presented at ISTFA 2012) 2012-11-14 The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique business venue for equipment suppliers, users and analysts to come together and do business, in a learning

3-axis CNC milling machine / high-precision / ion beam

Find out all of the information about the Hitachi High-Technologies Europe product: 3-axis CNC milling machine / high-precision / ion beam IM4000Plus. Contact a supplier or the parent company directly to get a quote or to find out a price or your closest point of sale.

Flat Ion Milling System IM-3000 Hitachi High

Hitachi Flat Milling System Effective for removal of sample surface layer or the final finish of mechanical polish Desktop and Compact Design Available beam irradiation angle 0 to 90° Process the range of ö5 mm uniformly Maximum specimen size ö50mm×H25mm

High rate milling of a mechanical pencil lead with the

Fig. 1 shows the results of cross-section milling of a 0.5 mm diameter mechanical pencil lead for 90 minutes with a conventional machine (IM4000 PLUS) and with an ArBlade 5000. The main composition of the lead is graphite, and it is known to be one of difficult materials to flatten by ion milling.

NEW: 3-axis milling system by Hitachi High-Technologies

The IM4000Plus Series Ion-Milling Systems are the second-generation of IM4000 series hybrid instruments that support Cross-Section Milling and Flatmilling®. A wide variety of system configurations are available: Standard, Cooling, Air Protection, and Cooling & Air Protection. Features Faster milling with improved ion optics (> 500 μm/h at 6 kV) Intermittent milling process for heat

Research Center for Magnetic and Spintronic Materials

Ion Milling for SEM obs. Hitachi IM4000. Three-dimensional Atom Probe; The 3D atom probe method can detect and identify the position of single atoms including light elements, which are difficult to observe with electron microscopes. It is also very effective in analyzing the distribution of elements within a variety of materials or devices

Hitachi Thermo Workshop

An in-depth look at the Hitachi IM4000 ion milling system, presenting several diverse applications that are possible using this instrument. Broad ion beam milling is capable of sectioning large cross-section areas of various materials, and can accommodate metallurgical mounted samples for flat milling in one machine to process large areas in

Blog » Sage Analytical Lab

Sage Analytical Lab has invested heavily in the latest machinery by Hitachi, The Model IM4000 Milling System OBE 0038. This latest machinery provides stress free physical processes whereby atoms are ejected from a target material due to bombardment of the target energetic particles.

Thermal aging effects on microstructures and mechanical

Nov 15, 2016· For preparing EBSD samples the mechanically polished samples were ion milled by a wide angle 3.5 kV beam in a Hitachi IM4000 ion milling machine. For preparing electron transparent thin samples for transmission electron microscopy (TEM) investigations the mechanically thinning step was limited to ~ 300 μm thickness due to reduced hardness of

[SCIENTIFIC INSTRUMENT NEWS Special site] Technical

The specimen was milled by Hitachi High-Tech's IM4000 ion-milling machine and subjected to X-ray analysis under low-vacuum conditions without evaporation. Oxygen, titanium, and zinc were detected in the impurity regions. In the backscattered electron images, the high-contrast striped pattern corresponds to regions in which zinc has segregated.

The Analytical UltraHighResolution SEM Hitachi SU-70

Consult Hitachi High-Technologies Europe's The Analytical UltraHighResolution SEM Hitachi SU-70 brochure on DirectIndustry. Page: 1/2

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Petrophysical assessment of Australian organic-rich shales

The Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) images of the shale samples were obtained using a Carl Zeiss AURIGA CrossBeam machine. A 0.5 mm 2 surface area of the sample was milled with a low energy argon ion beam (Hitachi IM4000 ion milling machine). The samples were mounted on stubs using a resin and coated with platinum

Hitachi High-Technologies Corporation (via Public

Introduction. Scanning electron microscopy (SEM), which is used to evaluate the microscopic morphology of specimens, has become essential for research and development in various areas of research, including metals, minerals, ceramics, cements, glasses, plastics, rubbers, petroleum products, paints, semiconductors, electronic components, and biomedical sciences.

ball mill technical specifi ion viacoladirienzo

In recent years, ion milling has been developed into the most applicable The Leica EM RES102 is a unique ion beam milling device that has two saddlefield ion sources with . Solder ball after ion beam polishing. HRTEM image Specifications. ION . technical expertise for the visualization, measurement, and analysis. Get Price